Used TEL / TOKYO ELECTRON P-8XL #293671052 for sale

TEL / TOKYO ELECTRON P-8XL is a prober designed for semiconductor wafer testing and associated processes. This prober operates on the basis of a multi-axis robot for positioning of the substrate, and can be equipped with a variety of probing heads. The multi-axis robot is composed of an X-axis, Y-axis, Z-axis, and rotary axis, allowing for precise movement of substrates and layers. It also includes a number of safety functions and drives, such as plate interlock, plate guide, pressure sensor, temperature sensor, and vibration damping. TEL P8XL is designed for ultra-large-scale integration (ULSI) of basic semiconductor devices such as DRAMs and logic devices. Its large working area has a working area of 1.5 x x1.2 mm as well as a 200 mm z-axis, ensuring that large substrates can be tested with high accuracy. It also features a 12-stage automated revolving stage, allowing for multiple devices to be tested simultaneously. Additionally, the prober's measurement accuracy is +/- 1.5 μm, meaning it can easily measure minute differences in layers and other structures. TOKYO ELECTRON P8-XL's probing heads incorporate a self-alignment system for quickly and precisely entering the probe positioning process. It also features an automated probe contact function, allowing for high-precision contact of the probe and the device under test. Furthermore, the automated probing head tracking function ensures accurate setting of the probing tip, and the prober can be set for either air-bonding or gold-bonding, depending on the device and process. TEL / TOKYO ELECTRON P 8 XL also features a built-in automatic recognition system, allowing it to "recognize" any device types and process steps. Such recognition functions are highly beneficial, as most devices are composed of complex circuits, and proper recognition of these circuits is essential for proper testing. Additionally, P-8 XL is compatible with a variety of operating systems, such as Windows or Linux. Overall, P 8 XL is a highly sophisticated prober for testing a wide range of semiconductor devices. Its accuracy and automated functions make it a highly reliable piece of testing equipment, and its compatibility with multiple operating systems ensures it can be easily integrated into a range of established processes.