Used TEL / TOKYO ELECTRON P-8XL #293712728 for sale

TEL / TOKYO ELECTRON P-8XL is a prober specifically designed for wafer testing and related semiconductor device testing. This prober is highly reliable and can be used in production applications demanding low maintenance costs. It is equipped with a 300mm indexer and a maximum probing force of 1000N. TEL P8XL has an integrated wafer handling equipment and automatic probe positioning, with a scribe line orientation accuracy of 0.1mm or better and a position accuracy of 0.02mm or better. TOKYO ELECTRON P8-XL also offers an optional box station, as well as cassette to cassette wafer transfer capabilities. TEL / TOKYO ELECTRON P-8 XL is a high-end prober with a wide range of capabilities. It includes a fully automated, single or dual electrode locating system with a X-Y resolution of 0.005mm or better, with onboard autofocus camera and frame grabber. The prober comes with a multi-mode probe station for manual alignment, programmable measurement patterns, and probed point measurement. TEL P-8 XL has an advanced parallel-acting suspension unit for accurate and repeatable surface flatness measurement. TEL P8-XL has has a 24-bit color graphical user interface (GUI), making it easy to operate and program. The machine also comes with a suite of data analysis tools for effective wafer checking, including a log-log coordinate tool, statistical analysis, and filter functions. In addition, P-8XL has an optional automatic wafer handling asset with parallelized lot processing and databank memory. The model also offers wafer bumping, voltage ramping, full photo sensing, and a range of equipment tests including IC probing measurements. P8-XL prober is designed for production quantity full-automated testing of semiconductor chips and wafers. This system is a reliable tool that can be utilized for the monitoring of various wafer and die-level components including bumping, voltage ramping, and electrical testing. It has been proven to be extremely robust and reliable under severe environmental conditions, making it an ideal choice for challenging production runs. Moreover, with its high level of accuracy, this unit is a great choice for semiconductor device production and testing.