Used TEL / TOKYO ELECTRON P-8XL #293742645 for sale

TEL / TOKYO ELECTRON P-8XL is a prober specifically designed for testing the performance and reliability of semiconductor devices. It is a high-precision, high-speed instrument that is capable of accurately controlling the positioning and movement of probes. The prober features a modular design with two main components: the controller and the probe-holder. The controller is responsible for the operation of the prober, while the probe-holder holds the electrical signal wires and the probes. The controller consists of a servo drive, a signal processor, and a CPU. The servo drive is responsible for the positioning of the prober and the movement of the probes, while the signal processor handles signal conditioning for the probes and the CPU is responsible for controlling the operation of the prober. TEL P8XL offers a wide variety of probes for testing various semiconductor device characteristics. It has various types of capacitive, inductive, and optical probes, which can be used to measure the current, voltage, power, or resistance of the device. Additionally, TOKYO ELECTRON P8-XL features tuneable probes that can be adjusted to measure up to five different characteristics. TOKYO ELECTRON P-8XL is also equipped with an alignment system that allows the user to quickly and accurately place the probes on the device. This alignment system uses a laser beam to detect the edge of the device and provide precise positioning of the probe on the device. The prober also features vision alignment that utilizes a camera to allow the user to accurately align the probe and perform automatic vector mapping of the device. For testing high-speed devices, TOKYO ELECTRON P 8 XL is capable of up to 50 microseconds of single-probe response time, as well as a dual-probe response time of up to 200 microseconds. It also supports various types of testing methods, such as time-domain reflectometry (TDR) and frequency-domain reflectometry (FDR). Additionally, the prober is equipped with a programmable test capability that allows the user to define their own test sequence and customize it to fit their specific application. TEL P-8 XL is a high-performance prober designed for testing the performance and reliability of semiconductor devices. It offers a wide variety of probes and an alignment system to accurately place and measure signals on the device. Additionally, it is capable of performing fast and precise testing with its high-speed single- and dual-probe response times. TEL P-8XL is a reliable and precise instrument that is ideal for testing semiconductor devices.