Used TEL / TOKYO ELECTRON P-8XL #293751909 for sale

TEL / TOKYO ELECTRON P-8XL is a highly advanced prober designed for use in semiconductor assembly, testing and inspection. It is designed to detect imperfections, shorts and opens in complex circuit boards in varying sizes. TEL P8XL is extremely precise and accurate, able to detect a defect size as low as 100 nanometers. It is a high throughput prober, capable of performing multiple processes simultaneously. This allows for rapid testing of chip assemblies and enables technicians to quickly find any faults and defects in a system. TOKYO ELECTRON P8-XL features advanced electrical testing features such as dielectric breakdown testing, capacitance testing, and impedance measurements. The prober has a large working area which can be used for up to 200mm wafer boards or substrates. This high wafer capacity allows for efficient test runs and enables quick analysis of the results. TEL P-8XL also features an integrated probe card, an optional wafer loading station, and a supporting system. The integrated probe card features 0.8µm pitch pins and up to 7200 pins. The optional loading station helps to simplify the process of loading and unloading the board, allowing for fast and efficient operations. TEL P 8 XL has been designed as an easy-to-use system which makes it ideal for users with limited technical knowledge. Its user-friendly 10.4" TFT touch-screen display enhances its usability and provides detailed information about the process and results. Furthermore, it has an integrated logger which helps to maintain an accurate record of the testing process. TEL / TOKYO ELECTRON P-8 XL's reliable operation and high performance make it suitable for the very precise and advanced semi-conductor assembly and testing. Its versatility in various applications and ease of use make it a preferred choice among semi-conductor companies.