Used TEL / TOKYO ELECTRON P-8XL #293761247 for sale

TEL / TOKYO ELECTRON P-8XL is a multi-functional prober designed to handle a variety of tasks. Utilizing a modular design, the prober can be easily configured. Its robust structure ensures reliable and accurate wafer inspection and probing. TEL P8XL is a fully automated prober that can be programmed to scan for defects on wafers, ensuring that acceptable products are created with a high degree of yield. Measuring the wafers can be performed automatically or by manually entering input parameters. The software features a built-in wizard guide, and it can be upgraded to monitor key statistics. The intuitive software provides maximum operability for a variety of scanning and probing tasks. The prober also offers a wide range of analytical capabilities. It can measure wafer thinness, surface texture, optical properties, and more. It features a large measurement area and high sample throughput. To ensure reliable results, the prober can be used in a wide temperature range. A powerful illuminated microscope is integrated into TOKYO ELECTRON P8-XL, providing an accurate and reliable surface inspection. This microscope utilizes a patented optical design to maximize its magnification capabilities, allowing the wafers to be inspected using various lighting conditions. The probe holder spindle system utilized on TOKYO ELECTRON P 8 XL provides a wide range of probe head and testing accessories. It has a maximum head speed of five-thousand rotations per minute and a maximum head torque of two-hundred-fifty-Newton centimeters. To complete the functionality of TOKYO ELECTRON P8XL, an integrated XY-stage is included. It features high resolution and low backlash, with a travel motion of X-axis thirty millimeters and Y-axis seventy millimeters. TOKYO ELECTRON P-8XL prober is reliable and efficient, providing maximum operability with its precision design. Its modular configuration and rich measuring capabilities ensure that it is a powerful and capable tool for many inspection and testing tasks.