Used TEL / TOKYO ELECTRON P-8XL #293766450 for sale

TEL / TOKYO ELECTRON P-8XL Prober is a high-performance automated prober that is used to inspect and test wafers or other surface mount devices. It is capable of providing rapid, accurate and reliable surface analysis across a wide range of sample sizes, shapes and geometries. The prober is well-suited for substrate testing and burn-in applications, such as semiconductor production. TEL P8XL Prober features a large table that is able to accommodate up to 8 wafers simultaneously, providing simultaneous inspection for every wafer. The equipment also includes an upgraded motor and drive system that offers increased resolution and speed, improving unit accuracy and repeatability. The Z-axis range has been increased for improved machine flexibility, and a new vacuum registration tool ensures accurate alignment of pins and pads. In addition, TOKYO ELECTRON P8-XL Prober is designed with a graphite based platform that is designed to reduce sample to chuck interface loading, while at the same time minimizing particulate contamination. This specialized platform minimizes loading forces and improves yield due to improved contact between the sample and prober table, providing a more stable environment for high accuracy processes. P 8 XL Prober also includes a precision motion asset to control the prober's x and y axis, providing rapid traversing, fine tune control and risk of overshoot. This advanced motion model allows for higher scan rates, in comparison to traditional probers, yielding faster probe times that can help to shorten overall production cycle times. TEL / TOKYO ELECTRON P 8 XL Prober is equipped with an array of built-in tools and commands for reliable and repeatable testing capabilities; such as a motor stop for high accuracy testing, adjustable x and y margin, one time sample auto-focus and an automated test matrix. The equipment also has an advanced IO interface, which is designed to increase system flexibility and compatibility and allows for easy integration into existing systems. Overall, TOKYO ELECTRON P-8XL Prober by TEL is a versatile and highly optimized testing tool for wafer and surface mount device testing. Its advanced motor and drive unit offer increased resolution, speed and accuracy, while still minimizing wear. Its specialized substrate testing platform is designed to minimize loading forces, improve contact between the sample and the prober table and reduce contamination. Finally, its built-in advanced features and software provide powerful programming capabilities and extend testing capabilities.