Used TEL / TOKYO ELECTRON P-8XL #293767333 for sale

Manufacturer
TEL / TOKYO ELECTRON
Model
P-8XL
ID: 293767333
Vintage: 2001
Prober Non-functional 2001 vintage.
TEL / TOKYO ELECTRON P-8XL is a state-of-the-art prober designed for various probing needs. It features a highly accurate and precise probing system, allowing for a wide range of applications from microelectronic to MEMS testing. With its high-performance design and robust construction, TEL P8XL provides a reliable platform for users to easily and efficiently probe wafers and devices without compromising on accuracy and performance. TOKYO ELECTRON P8-XL is equipped with an advanced probe positioning system that offers precise adjustment in X, Y, and Z-axis. Such high-precision control capability allows for accurate, repeatable probe placement and an ultra-smooth motion across the wafer or device surface. Additionally, it features an intuitive graphical user interface that allows operators to quickly and easily set up and adjust probing operations with minimal effort. This ensures that users can easily adjust to any changes or requirements in their probe positioning. In addition to its positioning features, TEL / TOKYO ELECTRON P-8 XL also offers a variety of testing and verification capabilities. It supports automated testing, measuring, and calibration operations. Additionally, users can program and execute diagnosis and evaluation of failure modes, defect types and fault conditions. In addition, its advanced testing capabilities include thermal mapping, thermal test, wafer sorting, and stress analysis. Such capabilities enable users to accurately identify and classify defects, reduce testing time, and enhance overall quality control. Overall, P8-XL prober is a reliable, high-performance solution for sophisticated probing tasks. Its advanced probing system, intuitive user interface, and wide array of testing and verification capabilities enable users to quickly and accurately analyze wafers and device surfaces. As such, it is an ideal instrument for MEMS, microelectronic, and other sampling applications.
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