Used TEL / TOKYO ELECTRON P-8XL #293773727 for sale

TEL / TOKYO ELECTRON P-8XL is a prober that provides superior precision in contact probing and comes with unique features to help streamline critical processes in the wafer probing process. With its high stability and dynamic operation, it is ideal for high speed, stable testing of IC components and devices. TEL P8XL has a high-accuracy coordinate equipment that can detect the precise 3D position of each IC device. These coordinates enable highly precise IC probing, improving IC functions and product quality. TOKYO ELECTRON P8-XL has a dual-axis stage design that provides a higher probe accuracy than a single-axis design. Its X-axis can be extended up to 830 mm, allowing for reduced variance in the loading and unloading process of a wafer or substrate. The Y-axis is designed for extended measurements, and a rotation mechanism can achieve fine movement within ±5 degrees. The unit also facilitates precise probing of different device parameters for analytical analysis. It has an accurate contact capability for spot measurement and Kelvin probe wafer analysis. TEL P 8 XL can be integrated with various tool sets, such as optical microscopes, metrology systems, and other measurements. It also offers sample isolation that reduces electrical noise while testing, further improving its accuracy. TOKYO ELECTRON P 8 XL includes a variety of other features, such as a test job management feature that helps reduce job redundancy and a remote control interface that enables remote operation and monitoring. An automatic calibration system is also included that compensates for mechanical variations in the probe driver. For improved maintenance, it also has a built-in self-diagnostic unit and a robust data archive facility. Overall, TEL / TOKYO ELECTRON P 8 XL is a versatile prober that offers superior precision in wafer probing. Its dual-axis design and extended measurement range enable accurate probing of different device parameters. Its variety of features, including an automatic calibration machine, remote control interface, and robust data archive facility, combine to streamline the probing process and ensure superior results.