Used TEL / TOKYO ELECTRON P-8XL #293778468 for sale

TEL / TOKYO ELECTRON P-8XL
Manufacturer
TEL / TOKYO ELECTRON
Model
P-8XL
ID: 293778468
Prober.
TEL / TOKYO ELECTRON P-8XL is a prober that is designed for performing advanced semiconductor device probing. It is specifically designed for advanced processes such as flipchip bonding, wafer-level testing and MEMS device testing. TEL P8XL prober uses an advanced X-Y-Z robotic stage and an integrated vision system to accurately position probes while maintaining excellent mechanical and thermal performance. The prober is capable of probing areas such as die pads, bumps, pads and other smaller components as well as larger devices with up to 10 micrometer resolution. The X-Y-Z stage also allows for precise alignment of springs and needles for maximum accuracy. In addition, TOKYO ELECTRON P8-XL prober is equipped with a number of features to ensure precision probing. These include a variable pressure system, which allows for adjustment of contact force levels. This feature is also used to ensure uniform contacts on probes when probing small and delicate devices. The open design of TOKYO ELECTRON P8XL allows for both standard and customized probe capabilities. TEL P-8XL also includes a built-in temperature ramping feature, which ensures uniform temperatures across the entire chip during testing. TEL / TOKYO ELECTRON P-8 XL prober is capable of supporting a variety of process requirements. It is compatible with a wide range of substrates, including silicon, Glass and quartz. It is also compatible with a variety of atmosphere and process requirements. TOKYO ELECTRON P-8 XL can support manual and automatic processes and is capable of handling surface mount probing and post-assembly testing. P8-XL prober offers flexibility, power and precision in the global semiconductor industry. With its advanced features, P 8 XL has quickly become one of the key tools for the development of new devices and technologies. Thanks to its capabilities, TEL P 8 XL prober is an essential component of most semiconductor device probing applications and is sure to continue to be a key component of the industry for years to come.
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