Used TEL / TOKYO ELECTRON P-8XL #293791471 for sale

Manufacturer
TEL / TOKYO ELECTRON
Model
P-8XL
ID: 293791471
Wafer Size: 8"
Vintage: 2004
Prober, 8" HF Hot chuck VIP3 Controller No OCR Temp range: Hot Chuck type: Nickel 2004 vintage.
TEL / TOKYO ELECTRON P-8XL Prober is a robust and powerful prober equipment designed for advanced semiconductor probing applications. The system offers a variety of features and benefits to help improve productivity, quality and reliability. TEL P8XL Prober is designed to facilitate efficient probing of IC's, memory, and CSP devices. It offers comprehensive inspection capabilities, including die-to-die, die-to-pad, pad-to-pad, and irregular area checks. The unit is designed with a large domain, which enables it to inspect multiple chips in one cycle. With its advanced air vibration control, the machine ensures uniform vibration control, allowing precise measurements and reliable results. The prober is equipped with a high-precision and large-area surface scanner. With its fast scanning speed and excellent signal-noise ratio, it is capable of detecting defects at nanoscale levels. The prober is also equipped with a high-resolution contact probe capable of increasing resolution up to 100 nm. The tool includes an integrated pre-alignment function that enables precise detection of key points and allows high-precision alignment. The mechanical structure of the proberis designed with a multiple-axis design, providing a rigid platform to ensure stable measurement accuracy. The asset is equipped with a high load capacityclamp, capable of working with various test devices and different spec sizes. The model also includes a unique air turbine punch support equipment, offering higher, faster, and more precise forcethan conventional probe systems. TOKYO ELECTRON P8-XL Prober is designed with a range of automatic functions including automatic handling, double-sided probe recognition, auto-focus, and mode retention functions. The system is also equipped with advanced safety features, such as operability and network safeguards, to help protect probes and devices against overloading and mishandling. The prober also includes advanced interface features, such as extreme curve management functionality, simplified user interface screens, and a comprehensive hardware and software control panel. P8-XL Prober offers advanced performance and reliability for critical semiconductor probing applications. With its robust features, ease of use, comprehensive safety features, and advanced measurement technologies, the prober provides efficient and reliable results.
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