Used TEL / TOKYO ELECTRON P-8XL #293791499 for sale

TEL / TOKYO ELECTRON P-8XL is a high-speed prober equipment designed to improve measurement precision and throughput for microelectronic devices. It is a semiconductor automated test equipment (ATE) designed for testing and characterizing integrated circuits (ICs). TEL P8XL has two axes of programmable motion and a Z-axis for depth measurement, enabling the prober to accurately measure, analyze, and take high-precision images of the device. TOKYO ELECTRON P8-XL has automated tape loading and an automatic test head that can be exchanged in seconds, allowing for quick device testing. The integrated computer system is designed to acquire parameters from the IC components and calculate yield. An advanced navigation unit ensures that the prober remains precisely aligned and that each measurement is consistently accurate. P8XL is capable of performing a wide range of tests, including electrical tests such as leakage current and resistance measurements, and optical tests for visual or infrared imaging. The prober is equipped with an advanced vision machine and has the ability to detect and analyze device features. An innovative air bearing tool ensures minimal and precise vibrations for stable probing performance. In addition, TOKYO ELECTRON P-8 XL is designed for a safe and clean testing environment. It is coated with a conductive paint to reduce static electricity, and all surfaces are hermetically sealed to prevent airborne contaminants from entering the asset. The prober is optimized for testing multiple samples simultaneously, simultaneously measuring parameters for more than one device at a time. It is also able to buffer several IC wafers, ensuring that probing operations can still be performed with different wafers without any re-rigging. TEL / TOKYO ELECTRON P8XL prober model is designed to provide cost-effective and accurate results that help semiconductor manufacturers meet production goals. With its fast and reliable performance, TEL P-8 XL is an essential tool for testing modern ICs for quality and reliability.