Used TEL / TOKYO ELECTRON P-8XL #293791502 for sale

Manufacturer
TEL / TOKYO ELECTRON
Model
P-8XL
ID: 293791502
Wafer Size: 8"
Vintage: 2006
Prober, 8" Hot chuck VIP3 Controller No OCR Temp range: Hot Chuck type: Nickel 2006 vintage.
TEL / TOKYO ELECTRON P-8XL prober is an extremely versatile and reliable equipment designed for advanced semiconductor probing. This high-performance prober incorporates the latest in accuracy and precision technologies, efficient fully automated and manual operation modes, easy to use intuitive user interface, and advanced features and functions. TEL P8XL is specifically designed to handle both single die, small substrates and full wafer probing with up to four 4" wafers at a time. It is equipped with an integrated triple stage, non-contact drive system with a unique patent-pending advanced damping mechanism to ensure high accuracy, repeatability and reliability. The separate stages adjust to the composite substrate surface and compensate for any warpage or damage. TOKYO ELECTRON P8-XL prober has a high-speed, multi-tasking software platform with built in algorithms for fast and accurate operation. The integrated Adaptive Vision Unit aligns the probe accurately and quickly, significantly reducing down-time. The intelligent wafer mapping feature, a feature usually found only in high-end ATE systems, allows for the firmware to be bypassed and the remaining elements to be accurately tested. The machine provides intelligent wafer handling ensuring safe and efficient operation. The prober's precision X/Y kinematics offers excellent repeatability and fast positional accuracy, allowing for detailed and complex probing of various types of test sites. Its Intelligent Content Scan (ICS) software allows you to easily locate test points and provide meaningful results in a flash. It also provides a broad range of additional features such as data analysis, wafer surface analysis and optimization, automatic scaling, drift compensation, and more. TEL P8-XL prober also offers advanced precision O/G measurement capabilities with a 6-axis active probe head and optional probe recognition tool. The extraordinary accuracy of the active probe head settings makes TEL P-8XL one of the best systems available. In addition, this prober is equipped with an onboard computer that can collect images from several different field-of-view settings, allowing for accurate inspection of even the most intricate probes. Overall, P8-XL is one of the most advanced and reliable probers available in the market today. It offers powerful performance in all aspects of wafer probing and testing operations, is user-friendly and easy to operate, and ensures reliable and accurate results at high speeds. TOKYO ELECTRON P-8 XL prober is an ideal solution for high-speed, high-precision wafer probing and testing.
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