Used TEL / TOKYO ELECTRON P-8XL #293791503 for sale

TEL / TOKYO ELECTRON P-8XL is a prober that is designed for semiconductor wafer testing and characterization. Its small footprint and high accuracy are perfect for applications where space is a concern. It has a flexible arm design which offers a wide range of angular positions and positions. This flexibility also allows it to be integrated into existing process environments without requiring major modifications. The prober features an integrated prober controller and a microscope tool head. The controller is used to control the equipment's overall operation and the microscope tool head is used to examine the wafer's surface features. It also has a high-capacity wafer cassette holder for loading and unloading the wafers during testing processes. TEL P8XL has an extensive range of features such as an XYZ stage for wafer positioning, a vision system for alignment and recognition, and a high-precision focus drive unit for precise probing. The XYZ stage has an adjustable height, position and angle settings which minimizes the mechanical and electrical stress on device. The microscope has a 1:1 to 4:1 zoom ratio and two high-performance cameras for detailed inspection. The prober also has a software-controlled power distribution machine and a multi-level test alarm feature. This feature allows the operator to turn on and off power sources depending on the specific task that is being executed. The operator can also adjust the power level of each test, based on the device that is being tested. TOKYO ELECTRON P8-XL has a wide range of configuration options which include electrostatic cells, tweezers, a chuck, DC sources, pulse generators, thermocouples, and air jet probes. These features enable the prober to be used for a variety of different test applications. TEL P-8 XL is also compatible with a wide range of market-leading software packages. Overall, P8-XL is an ideal prober for applications where accuracy and precision are of the utmost importance. Its flexibility, accuracy, and small footprint make it an excellent choice for many semiconductor device testing and characterization tasks.