Used TEL / TOKYO ELECTRON P-8XL #293791510 for sale

TEL / TOKYO ELECTRON P-8XL Prober is a high precision automatic prober for wafer probing applications. It features a dynamic, robotic wafer handling equipment that can provide ease of access to several wafer stages, including ones used for both heat mounting and resistivity measurement. The prober's accuracy is further enhanced by a servo-driven active spinner controller, which can provide precise control over the rotational position of the wafer. TEL P8XL also has an integrated optical microscope that allows for the inspection of tips, surfaces and other areas of the wafer for potential scratches, contaminants, and other surface irregularities. A vacuum wand is used to secure the wafer in place, and this same wand can also be used for driving the robot tapes for wafer transfer. The wafer mounting system also includes rail guides for wafer positioning, and the tilt device adjusts the angle of the wafer with respect to the probe tip. The prober uses a low voltage electrical testing unit, with a simple connection scheme that minimizes grounding difficulties that can lead to faulty testing results. This machine is calibrated regularly to ensure the accuracy of the test results. The drive circuitry features a very small settling time, which reduces measurement time and minimizes damage to the wafer. The prober's touch-down tool is designed to reduce the contact force between the probe tip and the wafer, while still providing a good electrical connection. TOKYO ELECTRON P8-XL is equipped with various features to ensure a safe and efficient working environment. The prober is designed with an emergency power-off switch, and there is even an anti-static feature that triggers the power-off switch when a potential short circuit is detected. For total control, the prober includes a digital-to-analog conversion circuit with multiplexing capability, which allows the user to easily switch between multiple test modes. The prober also contains an auto-leveling asset, ensuring that the probe tip always maintains an even distance from the wafer surface. In addition to its safety and ease-of-use features, TEL / TOKYO ELECTRON P8-XL is built for accuracy. As an example of this, the wafer test pattern can be saved prior to testing, which can be used to check the accuracy of the test results. This helps the user to ensure that the data reported is correct and valid. The prober is also designed to minimize the amount of time taken to complete measurements, which makes it a suitable choice for a variety of wafer probing needs.