Used TEL / TOKYO ELECTRON P-8XL #293791511 for sale

Manufacturer
TEL / TOKYO ELECTRON
Model
P-8XL
ID: 293791511
Wafer Size: 8"
Vintage: 2006
Prober, 8" Hot chuck VIP3 Controller No OCR Temp range: Hot Chuck type: Nickel 2006 vintage.
TEL / TOKYO ELECTRON P-8XL is a high-precision, fully automated prober designed for the testing and characterization of semiconductor processing equipment. It is capable of accurately measuring minute electrical signals, low-voltage characteristics, and device characteristics with a high degree of accuracy. The prober utilizes high-accuracy interferometric length measurement systems and advanced design features, resulting in superior measurement accuracy, repeatability, and reliability. TEL P8XL is equipped with a unique height sensing tweezers extension & piezo actuation equipment that allows ultra-precise contact point location control, ensuring the utmost fidelity of measurements. The advanced electron microscope-based image recognition system further ensures accuracy, featuring built-in image regulation and distortion correction. The prober is further equipped with an automated wafer magazine, enabling automatic unloading and loading of wafers without operator intervention. This eliminates the need for manual handling of wafers, improving throughput and reducing the risk of contamination. The prober is further capable of testing wafers of various sizes and thicknesses. This prober is designed to meet the most demanding needs of semiconductor manufacturers, featuring advanced motion control and accurate heat detection systems. Its motion control unit ensures smooth and repeatable motion profiles for scanning and probing activities, and its heat detection machine enables accurate temperature control for the testing process. In addition, automatic vision alignment systems and advanced data acquisition systems are also included, further adding to the functionality of the prober. TOKYO ELECTRON P8-XL has been proven to offer superior performance in a range of settings, such as IC package probing, high-voltage probing, and scan chain testing. It is reliable, durable, and customizable, offering an ideal solution for semiconductor device testing and characterization. With its comprehensive features, the prober provides an efficient and accurate solution for production environments.
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