Used TEL / TOKYO ELECTRON P-8XL #293791517 for sale

TEL / TOKYO ELECTRON P-8XL is a prober designed to offer excellent test access and performance. The prober offers a wide range of probes designed to meet the challenges of various applications. It is designed with an open architecture, providing flexibility to quickly and accurately fit a variety of wafer sizes, probes, loaders and test interfaces. With its robust design, TEL P8XL provides the most reliable and stable performance for all challenging testing applications. TOKYO ELECTRON P8-XL features a robust wafer elevator and a dielectric isolator design that effectively minimizes crosstalk between probes. The probes can measure from 3 mm to 12 mm of contact resistance and has a wide range of height and force adjustment range. The open architecture of the prober also provides compatibility with automation, a choice of test interfaces, and multiple loads and probe sizes. TEL P8-XL is a versatile prober, capable of supporting multiple testing applications such as high-density wafer probing, parallel wafer probing, and wafer backside testing. With its full range of wafer probes, it ensures accurate and reliable test results. Moreover, the high-precision parallelism fixtures enable consistent alignment and repeatability. Additionally, TEL / TOKYO ELECTRON P 8 XL is designed with a Data Acquisition System (DAS) that provides detailed test result analysis and real-time online data display which are analyzed to set a database and support improved overall yield. In terms of safety and reliability, TEL / TOKYO ELECTRON P8XL's new models have built-in pressure sensors and motor control systems that are designed to provide maximum stability and repeatability. Furthermore, the software is compatible with all of the standard semiconductor testing software platforms and has been tested for compatibility. Overall, TEL / TOKYO ELECTRON P8-XL is an excellent choice for any applications that require accurate and reliable test results and data acquisition. Its robust design and reliable performance ensure maximum efficiency and productivity for all testing applications.