Used TEL / TOKYO ELECTRON P-8XL #293802815 for sale

TEL / TOKYO ELECTRON P-8XL prober is a versatile and advanced tool used in the semiconductor industry. It is capable of measuring a wide range of electrical parameters and making certain contact, thermal, and other physical measurements. The core structure of TEL P8XL is composed of an X-Y stages and a dual-axis z-stage. These components enable the tool to perform contact probing, wafer mapping, and parameter extraction and testing. Additionally, this prober can also be used for Failure Analysis (FA) studies for accurate defect isolation and troubleshooting purposes. The X-Y stages of TOKYO ELECTRON P8-XL prober consist of two independent servo-driven, high-precision motors that enable X-Y repositioning over a large area. The two ballscrews and two linear roller bearings provide smooth linear motion and accuracy for repeatable contact probing. TOKYO ELECTRON P-8XL prober also features an upgradable multi-axis z-stage. This mechanical tool helps to ensure reliable contact during probing and test operations. It also incorporates high-resolution stepper motors to facilitate precise Z-axis motion and accurate positioning. TEL P 8 XL prober also offers a unique thermal platform. This platform helps to provide reliable heat displacement in the X-Y stages during test operations. It also offers a range of temperature control units which helps the tool to accurately adjust heat to the exact specifications required. Moreover, P8-XL prober can be further upgraded with extra accessories such as a vision system or a high-voltage contact metrology system. This allows the tool to become more versatile and suitable for a variety of applications. All-in-all, P8XL prober is a highly advanced and reliable tool for probing and testing the electrical features of semiconductor devices. The tool has an upgradable multi-axis z-stage and a thermal platform which ensures accurate and repeatable testing. TEL / TOKYO ELECTRON P-8 XL also offers extra accessories which can further increase its versatility and ability to handle a wide variety of semiconductor tests.