Used TEL / TOKYO ELECTRON P-8XL #293802816 for sale

TEL / TOKYO ELECTRON P-8XL is an advanced prober designed for a variety of semiconductor process materials testing, such as dicing and probing. This prober is used to monitor and measure characteristics of wafers, die and other devices in critical processes. The prober is designed to meet the highest industry standards in terms of performance, accuracy and reliability. TEL P8XL prober provides fast, accurate, and repeatable measuring and testing to ensure that the devices manufactured through critical processes meet customer specifications. The test and measurement system is equipped with a state-of-the-art probing head, precision stages and optical system. The head of the prober is equipped with a combination of a high-resolution motion stage, a laser displacement sensor and a MEMS-based optical interrogation system. The motion stage and laser displacement sensor enable fast, accurate probing as well as allowing for the high-accuracy measurement of any indents and marks on the surface of the device. TOKYO ELECTRON P8-XL also features an automated process correction (APC) feature, which provides high-speed tracking of die positions and measuring fine indentations even in large wafer dies. Due to its integrated motion axis, any fine detailed coating, or dropped dies can be quickly compensated. The prober is equipped with multiple types of stages including a polysherical stage, a CMOS slit scan stage, a CradleSet stage, a laser cutting stage, and a probe card holder. The polysherical stage ensures that the surface of the Wafer/die is even and flat. The CMOS slit scan stage allows for accurate alignment and placement of the prober relative to the wafer. The CradleSet stage is used to accurately scan and test die patterns on a photomask. The laser cutting stage allows for repeatable cutting and positioning of a wafer. The probe card holder supports multiple data pin configurations for improved accuracy and flexibility in testing. TOKYO ELECTRON P-8XL is designed with a column type video microscope and a powerful die inspection user interface. It is equipped with advanced optics and high-resolution cameras to capture and inspect features of the wafer being tested. The microscope also provides detailed images of wafer and die surfaces with a variety of magnifications, enabling the operator to validate features of the wafer being tested. TOKYO ELECTRON P8XL is a highly reliable and versatile prober designed for accurate measurement and testing of a variety of semiconductor process materials. With its wide range of features, it ensures that customer device specifications are met with a high level of precision, accuracy, repeatability and reliability.