Used TEL / TOKYO ELECTRON P-8XL #293806977 for sale

TEL / TOKYO ELECTRON P-8XL is an advanced prober that offers high-accuracy probing ideal for contact checking of wafers and IC chips. It has been designed with advanced features to provide a simple, integrated measurement and test solution for a wide range of components used in consumer, industrial and medical technologies. It is well-suited for wafer and IC package testing and is capable of a wide array of measurements including capacitance, resistance, temperature, voltage, and current. This prober has a high-speed XY scanning mechanism that offers highly accurate step-and-repeat XY scanning. It features a high-speed signal transmission board for reduced time for examination processes and for reduced X-ray scan times. It is suitable for wafer and package probing with signal integrity, power integrity and ESD testing requirements. The prober also features a host of useful features, such as a wafer adaptive air gap algorithm and forced bevel probe control functionality. It also offers state-of-the-art temperature control with advanced auto tuning technique for optimal stability and accuracy. TEL P8XL is designed for a wide variety of products for both manual and automatic probing. It offers a 25 pin, low-probe height, liquid-tight probe card to reduce scratching on fragile traces. It also has the ability to detect false clamps and looseness of spring contact of the pin card quickly. Additionally, the prober incorporates a wafer mapping system with a probability indicator for partial and full wafer mapping. For testing applications, it offers several tests, such as power cyclic test, intermitting contact test, low and high level current test, gang testing, ESD testing, AC/DC Voltage testing, Delta-Lon testing, and DC meter testing. It also supports parallel, serial and coaxial bus testing. TOKYO ELECTRON P8-XL prober also supports third-party test equipment such as interface boards, external test equipment, and testers. Overall, TEL / TOKYO ELECTRON P8-XL is an advanced prober that is suitable for advanced probing technologies, as well as for testing a wide variety of products. It features superior features for high accuracy probing, is designed for both manual and automatic operation, and supports third-party test equipment. The prober is capable of a wide array of measurements and tests, making it a viable option for testing applications.