Used TEL / TOKYO ELECTRON P-8XL #293807104 for sale

TEL / TOKYO ELECTRON P-8XL
Manufacturer
TEL / TOKYO ELECTRON
Model
P-8XL
ID: 293807104
Wafer Size: 8"
Prober, 8".
TEL / TOKYO ELECTRON P-8XL prober is a cutting-edge tool used for probing semiconductor wafers for various applications. It is specifically designed for probing chips without damaging the electrical characteristics of the chip. This cutting-edge prober is manufactured by TEL, one of the leading suppliers of semiconductor inspection and production equipment. TEL P8XL has a unique design composed of a semi-automated pulsed electrohydrodynamic ejection equipment. This prober uses a vibrating probe that is mounted onto a tip transfer system to probe the electrical properties of chips with minimal damage. The prober is able to detect various electrical characteristics, such as voltage, current, capacitance, resistance, and noise parameters. TOKYO ELECTRON P8-XL is also able to accurately detect resistive and capacitive defects on chip surfaces. P 8 XL also has an advanced vision unit that is capable of detecting different features on the chip that are not detectable with the naked eye. TEL P8-XL has a robust and reliable vision machine that is able to detect various features and defects on chips, such as wafer-bonded defects, scratches, and delamination. TEL P-8 XL is specifically designed for analyzing ICs with its complex design, consisting of a Floating-Substrate Repulsive Electrodes, Self-Aligned Probe Tool, and a specialized inspection asset. This unique combination of integrated components enables TEL P 8 XL to accurately detect a wide variety of semiconductor defects. P8XL is also outfitted with a variety of advanced systems, such as thermal mapping, test sub-model, auto-identification processing equipment, and fully automated operation. TEL / TOKYO ELECTRON P8-XL prober is a state-of-the-art tool used for probing ICs for various applications. Its fuzzy dynamic detection technology ensures accurate readings, as well as precision measurements of a variety of electrical parameters. Its advanced vision system is also able to detect various chip features that cannot be seen with the naked eye. TEL P-8XL is an ideal tool for probing chips without damaging their electrical characteristics.
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