Used TEL / TOKYO ELECTRON P-8XL #293809596 for sale

TEL / TOKYO ELECTRON P-8XL prober is the latest in advanced probing technology for semiconductor devices and integrated circuits (IC). It is used to map electrical characteristics of ICs in conjunction with a scan electron microscope. The advanced features of this prober make it an ideal tool for laboratory and academic experiments, as well as in production environments for manufacturers of ICs. The prober uses a semi-automated system to measure capacitance, inductance, or resistance through a scanning/image/probing process. This ensures high degrees of accuracy in data collection. It is compatible with a variety of different probes, such as electrical, thermal, or optical, and can be used in conjunction with other equipment. TEL P8XL prober has a large working area which provides ample space to move the probing arm and other components. This space also serves to reduce vibration so that data from the probe accurately reflects the device under analysis. The prober supports up to six (6) axis of motion. Three (3) linear X, Y, and Z stages, rotary and tilt axes, together with a sample shutter. The range of motion available to the prober arm makes it suitable for small and large geometry probing. The prober boasts a user-friendly interface that allows for efficient operation. Software enables the user to load different probe routines onto the device, allowing for probing of various kinds of devices including RF, mixed signal, and Digital circuits. This software also includes graphical representation of IC layout, allowing the user to quickly load and edit probing paths to obtain the desired data. The prober is equipped with an onboard data logger to keep track of each measurement. The data is stored in a easy-to-understand format and can be accessed by the user at any time. This is useful for keeping track of important measurements for further analysis. Lastly, TOKYO ELECTRON P8-XL prober has a fast response time, allowing the user to quickly analyze data points. The prober also has a low noise level which reduces interference during probing. These features reduce measurement errors that can occur due to misinterpretation of data. This prober is the perfect tool for IC development and production processes in today's modern manufacturing environment.