Used TEL / TOKYO ELECTRON P-8XL #293809912 for sale

Manufacturer
TEL / TOKYO ELECTRON
Model
P-8XL
ID: 293809912
Vintage: 2000
Prober 2000 vintage.
'TEL / TOKYO ELECTRON P-8XL' is a prober by TEL Ltd. (TOKYO ELECTRON) that is used to evaluate various types of integrated circuit (ICs). TEL P8XL is an automated optical inspection tool designed to detect defects on the IC surface such as scratches, bare spots, fingerprints, hairline cracks, and voids. It can also be used to measure thicknesses on bump metallizations, measure film thickness, and measure for thickness variations. TOKYO ELECTRON P8-XL is composed of a sphere scanning platform, an optical detection equipment, and automation functions all integrated together. The sphere scanning platform is an ultra-precision scanning system that consists of two rotary tables, distal objective lens, a proximity focus mechanism for control of surface profile and center position, and automated stage control. The optical detection unit is a high-resolution vision machine to detect defects on various ICs. This tool is capable of adjusting the optical path for various IC sizes and geometries, and also supports the use of various kinds of illumination light source. The automation functions of TEL / TOKYO ELECTRON P-8 XL enable it to perform automatic alignment with the substrate surface and automatic focus adjustment for various types of substrate surfaces. The innovative software can distinguish the defect from the normal patterns on the IC, and can accurately measure fine IC patterns for various IC structure types. In addition to this, the tool can analyze and simulate various processes that are related to the IC manufacturing trend of miniaturization, integration, and precision. TEL / TOKYO ELECTRON P 8 XL prober is built to handle various substrate sizes and types of test, such as defect review and metrology. It is designed to analyze ICs accurately and quickly, at high throughput speeds. This helps to ensure the quality and reliability of the ICs being manufactured, by efficiently detecting defects and evaluating the performance of the IC. This makes TEL P 8 XL a key tool in the semiconductor manufacturing process.
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