Used TEL / TOKYO ELECTRON P-8XL #293827264 for sale

TEL / TOKYO ELECTRON P-8XL prober is an automation equipment designed to safely and accurately test semiconductor devices. It is designed to handle a wide variety of wafer sizes as well as a variety of probe cards, ensuring a highly optimized and valuable test environment. It features a patented probe design that enables superior accuracy and reliability, as well as a P1-8XL contact force control system that provides precise and repeatable accuracy. The unit also features an advanced contact recognition machine and algorithm, designed to detect failed contacts even in the harshest of environments. TEL P8XL prober also features a dual axis, high-speed wafer stage movement tool, capable of speeds up to 11.8 in. (300 mm) per second, providing highly accurate navigation and positioning. The four-axis motion asset on the prober also enables smooth motion for fast, accurate patterns with minimal jump time, resulting in an increase in test throughput. TOKYO ELECTRON P8-XL prober also features an auto-calibrating imaging model that utilizes an enhanced color filter that enables up to 200 imaging points per wafer, ensuring precise and reliable images. Additionally, the equipment also features a self-diagnostic capability in addition to a self-correction system to ensure continuous operation and improved test consistency and yield. TOKYO ELECTRON P8XL prober is designed to handle up to 8 simultaneous probes with a maximum of 18 simultaneous contacts, ensuring superior test coverage and reliability. The unit also features an interlock machine that prevents the motor from overloading in the case of accidental input. Additionally, TOKYO ELECTRON P-8 XL prober features a high-performance thermal conditioning tool designed to maintain a wide range of temperatures during testing, ranging from -40°C to +150°C, allowing for reliable testing and improved test coverage. To sum up, P-8XL prober is an advanced automation asset designed to safely and accurately test semiconductor devices, delivering superior accuracy and reliability. With its unique design and advanced features, it provides efficient and reliable test coverage for a wide variety of semiconductor devices.