Used TEL / TOKYO ELECTRON P-8XL #9076976 for sale

TEL / TOKYO ELECTRON P-8XL prober is a semi-automated prober designed for wafer inspection, testing, and alignment. It is used to measure electrical characteristics of semiconductor devices. The prober is a scalable platform that supports many different sizes of prober heads, depending on the application. It uses two-dimensional metrology and optical recognition to precisely align and measure device parameters. The prober base is constructed with a rigid, aluminum-alloy frame and an air-bearing surface table for smooth motion requiring minimal vibration. It features a long, X-Y travel distance which enhances its throughput and scalability features. The prober base is equipped with an air-bearing skid for the prober head, offering precise horizontal movement, aiding during the automated alignment process. The prober components include a prober head, a test head module, an alignment equipment, and a measurement system. The prober head is capable of wafer handling and site mapping, prober head orientation, optical alignment, and load/unload of the test head module. The test head module performs standard testing functions, such as voltage, current, resistance, leakage, and capacitance measurements. The prober alignment unit is based on CCD cameras and precision optics. It is fully automated and can be programmed to align the probe tips with high accuracy. The prober measurement machine is based on a built-in software that can measure wafer parameters with high accuracy. TEL P8XL prober offers a highly automated tool for accurate wafer measurements and testing. It combines high accuracy, reliability, and scalability, making it a suitable choice for wafer inspection, testing, and alignment requirements. The asset can be programmed to calibrate and scan wafers in an efficient manner. With its long x-y travel distance, the model can easily be upgraded for more advanced functions.