Used TEL / TOKYO ELECTRON P-8XL #9080839 for sale

TEL / TOKYO ELECTRON P-8XL is a prober designed to probe and test semiconductor devices. It features a robust design that allows for precise probing and testing of specimens ranging in size from 3 x 3mm to a full wafer size. TEL P8XL is designed with a high repeatability and accuracy for probing and testing, and a wide range of movement, speed and flexibility of auto-correction for various semiconductor samples. The operator is given a high level of control over the unit with a 7-inch monitor and touch panel display, allowing easy access to the probing and testing parameters which can be quickly adjusted or fine-tuned to meet even the most complex of probing and testing needs. The monitor also displays the status of the test and a summary of the results of the software-controlled probing and testing. TOKYO ELECTRON P8-XL features a wafer mapping and pre-alignment equipment. This system utilizes non-contact optical sensing and image analysis technology to accurately identify the probe tip positions on the device under test and can map out a full wafer layout in a fraction of a second. This unit is highly reliable and surprisingly accurate, with a repeat accuracy of up to 5 μm. P-8 XL also allows for low noise operation with a noise level as low as 10 dB. This reduces the risk of interference from the surrounding environment during testing and is essential for reliable probing and testing. The built-in software machine on TEL P-8 XL is highly customizable and allows for data parameters to be tailored to customer needs, with up to 64 probe sequences available for each test. It also contains extensive pattern comparison and measurement functions to assess the quality of the devices being tested. P8-XL prober is designed for accuracy in testing and probing. It features a robust design, low noise operation and high repeatability and accuracy, as well as a wide range of movements and flexible auto-correction for various devices. The built-in software tool allows for a variety of customizable parameters, and the wafer mapping and pre-alignment asset ensures reliable testing results. With its capabilities, this prober is an invaluable aid in semiconductor production and testing.