Used TEL / TOKYO ELECTRON P-8XL #9083918 for sale

TEL / TOKYO ELECTRON P-8XL prober is a semiconductor test equipment designed for high-volume testing of large-scale semiconductor components. It is a fully automated solution, allowing for the efficient and accurate testing of integrated circuit elements. The prober is designed for high throughput, making it ideal for rigorous testing of large circuit components. TEL P8XL is equipped with a digital imaging microscope that enables accurate and precise alignment of the components under test. The system supports several probe type options, such as a digital optical microscope, a ultra-precise scanning microscope, and an adjustable contact probe. All of these probes can be used together to ensure that each component will be accurately tested. TOKYO ELECTRON P8-XL also features a range of unique automated processes, such as automatic set-up and testing. This means that test programs can be quickly and easily created and loaded into the prober. It also features an advanced parallel testing unit and automatic test pattern alignment, which allow for simultaneous testing of multiple components at once. This highly-efficient testing process also helps reduce test cycle time. TEL / TOKYO ELECTRON P-8 XL features a variety of integrated test management features, such as a financial management suite, a wafer inspect suite, and a defect inspection suite. These tools help the user to efficiently test, monitor and analyze testing results. It also features an automated calibration machine to ensure accurate test results. TOKYO ELECTRON P8XL prober has been designed and manufactured to provide reliable performance for a wide array of semiconductor applications. It is CE, RoHS, and UL certified, and comes with a comprehensive warranty. The tool is also compatible with a wide range of popular test languages and third-party test systems. In conclusion, P 8 XL prober is a flexible and reliable testing solution for integrated circuit components. It features an automated testing software, an advanced parallel testing asset, along with a range of management features and calibration systems to ensure accuracy and thorough testing.