Used TEL / TOKYO ELECTRON P-8XL #9131722 for sale
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ID: 9131722
Wafer Size: 8"
Vintage: 2002
Prober, 8”
Hot cold
200v
Power cable
Head plate
Gas-spring on headplate
Printer
SACC: 200/300
Standard monitor
Card holder
Manipulator
Wafer table
Boards:
147-CON
VIP3
GP-IB
TVB9003-1316
QMC#0
QMC#1
DMC3#2
Tester
I/F
M-1
M-2
LST-1
LST-2
PST-STD
PST-OPT
SIO
2002 vintage.
TEL / TOKYO ELECTRON P-8XL is a prober designed for testing the electrical characteristics of semiconductor devices. It is constructed with a sturdy chassis and provides high-precision force and temperature control to ensure accurate and reliable testing at a wide variety of speeds. The equipment also has a computer-controlled clamp block to hold the device during testing. TEL P8XL has a built-in display that provides the user with a quick overview of the test results. It also offers a menu-driven user interface for easy navigation. The system has a built-in measurement unit that can measure a variety of parameters such as resistance, capacitance, voltage, power, and current. TOKYO ELECTRON P8-XL prober has a high measuring speed and powerful data processing capabilities for efficient testing. It offers superior temperature stability that ensures accurate values even at high testing speeds. The machine includes temperature control algorithms to eliminate problems due to temperature changes. TEL P8-XL is designed to be easily maintained and serviced with its modular design, making it easy to upgrade and expand. The tool comes with mechanical calibration and calibration curves that ensure accurate results from the first test to the last. P-8 XL also includes automated testing, which greatly speeds up testing time. It can be remotely controlled via Ethernet and can store massive amounts of test data. The asset is also compliant with industry standards such as JEDEC and Mil-Std-883, making for more reliable testing. Overall, TEL P-8 XL is a powerful yet simple prober, offering a host of features and benefits to ensure accurate and reliable testing for a wide variety of semiconductor devices. The model is built for high test speed and is highly accurate, making it a great choice for any testing need.
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