Used TEL / TOKYO ELECTRON P-8XL #9131749 for sale

TEL / TOKYO ELECTRON P-8XL is an extremely precise prober designed for semiconductor testing and analysis. It is capable of making high-resolution, high-precision measurements of device structures such as transistors, memory cells, and digital circuits. The equipment is a very versatile tool, which can be used to analyze device properties and yield test data for various testing purposes such as parametric and functional testing. The prober is self-contained and offers a simple to use and intuitive graphical user interface, making it an ideal tool for both experienced engineers and those new to the semiconductor industry. TEL P8XL is a fully automated, multi-probe prober system. It offers a wide range of probes and measurement capabilities, including applications such as parametric electrical test, dynamic voltage stressing, monolithic stress characterization and device characterization. It is capable of working with both hard and soft probes, allowing for high-resolution mapping of device structures. The unit is equipped with a high-performance Vision analysis machine, allowing inspectors to compare and contrast electron micrographs with the device's design specifications. It has the ability to accurately measure the shape/size of the device structures, allowing engineers to ensure the testing is done accurately. TOKYO ELECTRON P8-XL also features an advanced adaptive scan strategy, which allows engineers to choose the most suitable scan parameters for their application. The prober tool has numerous safety features, including an over-pressure protection asset, which prevents shocks to the samples during pressure. It also contains an overheat cut-out function, preventing operation errors caused by excessive temperatures during testing. To further protect the samples, it is equipped with an automated calibration model that will calibrate both probe-sample pressure and sample temperature. Overall, TEL / TOKYO ELECTRON P 8 XL is an extremely precise prober designed for precise semiconductor testing and analysis. Its highly versatile capabilities, automated testing strategies, safety features, and reliable performance make it an ideal choice for research and development in the semiconductor industry.