Used TEL / TOKYO ELECTRON P-8XL #9131769 for sale

TEL / TOKYO ELECTRON P-8XL is a prober designed for high-precision and high-speed electrical testing of advanced integrated circuits, semiconductors and other electronic products for the manufacturing industry. It is equipped with state-of-the-art probing technology and provides superior accuracy and repeatability in electrical probing and testing. TEL P8XL prober features high-precision probing and testing, with repeatability of +/- 0.4μm. This ensures that the probing data collected by this prober is of superior accuracy and repeatability. Additionally, the prober offers automatic wafer alignment and data acquisition, as well as automatic defect recognition. The prober also features high-speed probing capability, with a probing speed up to 200um/s, which makes it ideal for high volume production. It is equipped with a high-performance Z-axis servo motor and a wafer scanning speed of up to 60um/s. The prober's rigid structure ensures that excellent high-speed and stable probing is also possible on complex semiconductor structures. TOKYO ELECTRON P8-XL prober also offers superior repeatability and reliability in electrode testing, probing, and data collection. It is equipped with a multi-point OLED display for easy setup of the instrument. The prober also allows the setup and operation of peripheral devices with USB, and supports an automatic die-by-die probing feature for non-contact die identification. Furthermore, the prober has an advanced evaluation software that enables the evaluation of differential time characteristics, thermal data, structural paths, characteristics data, among other parameters. This software can be used for precision measurement of various electrical characteristics of samples, such as voltage, current, and resistance. Overall, P 8 XL prober is a reliable and powerful tool for electrical testing and probing of advanced integrated circuits, semiconductors, and other electronic products. With its high-precision probing and testing features, it ensures a superior accuracy and repeatability in all its probing and testing applications. Additionally, it allows for fast and reliable wafer scanning, as well as precise die-by-die electrical testing.