Used TEL / TOKYO ELECTRON P-8XL #9131775 for sale
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ID: 9131775
Wafer Size: 8"
Vintage: 2000
Prober, 8"
Gold
Hot cold
200v
GP-IB Cable
Head plate
Gas-spring on headplate
Standard monitor
WAPP-10K with brush
Card holder
Manipulator
Wafer table
Printer
SACC: 200/300
Boards:
147-CON
VIP3
GP-IB
TVB9003-1316
QMC#0
QMC#1
DMC3#2
Tester
I/F
M-1
M-2
LST-1
LST-2
PST-STD
PST-OPT
SIO
2000 vintage.
TEL / TOKYO ELECTRON P-8XL is a prober designed to provide characterization of materials used in the production of semiconductors. It is one of the most well-known probers available on the market and has become the go-to tool for engineers and technicians involved in material testing. TEL P8XL is designed to be used with semiconductor wafers up to 300mm in diameter. The device is equipped with a high-precision computer-controlled motor, allowing the user to accurately place a test specimen onto the X-Y precision stage with accuracy up to 0.01 microns. Once the specimen is attached to the stage, the capacitance-micrometer-based microprobe can take measurements from the wafer with an accuracy up to 0.0001 microns. The microprobe has a wide range of mechanical and electrical probes, making it easy to tailor the instrument to specific test protocols. The device is equipped with various automated functions, such as an autofocus system, automatic calibration checking, and an automated wafer cleaning system. These features number of advanced features make it easy for the user to perform tests quickly and accurately. In terms of features, TOKYO ELECTRON P8-XL is also compatible with a number of specialized software packages, allowing the user to easily perform several analysis functions on the collected data. This includes functions such as electrical testing, thermal mapping, and leakage analysis. TOKYO ELECTRON P 8 XL is an excellent tool for engineers and technicians that need to test the properties of semiconductor materials. Its various automated features and wide range of compatible measurement probes make it extremely easy and accurate to use in any testing environment.
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