Used TEL / TOKYO ELECTRON P-8XL #9132754 for sale

TEL / TOKYO ELECTRON P-8XL Prober is the leading wafer test equipment for semiconductor chips. It features a semiconductor test bed with an integrated voltage-monitored test head, which makes it suitable for a variety of wafer-level testing applications. TEL P8XL is capable of testing a wide range of chips with its high accuracy and precision. TOKYO ELECTRON P8-XL offers a full range of features. It has the capability to detect voltage levels at the die level, which is critical for high-volume production lines. The prober also has the ability to detect current leakage for all major die pads, which is useful for testing reliability of chips. Other features include dual-axis sample stage motion and parallel-aligned optics, which ensure high-accuracy wafer positioning and optimal detection of signals. The system also has the ability to measure surface and temperature characteristics of chips, which are essential for device characterization and engineering. The probe also has an advanced wafer contact unit. It is designed to minimize contact tip wear while improving the reliability of wafer measurement. TEL / TOKYO ELECTRON P8XL has a unique tensioning mechanism, which can be used to adjust the contact force and provides optimal performance for a wide range of test conditions. It also includes an automatic leveling function that can precisely adjust the elevation of the probe tip relative to the wafer surface. P 8 XL also offers a user-friendly interface, which makes it easy to operate and manage. It includes an easy-to-use graphical user interface with multiple display and configuration options. Its powerful diagnostic and error logging capabilities make it possible to quickly diagnose and repair the machine should an issue arise. Overall, TEL P 8 XL Prober is an excellent tool for wafer-level testing applications. Its features provide a high degree of accuracy and reliability, while its intuitive user interface makes it easy to use and maintain. With all these features, it is no wonder this prober is the leading tool for testing semiconductor chips.