Used TEL / TOKYO ELECTRON P-8XL #9152941 for sale

TEL / TOKYO ELECTRON P-8XL prober is a high-performance worktable inspection equipment developed by TEL. At its core, TEL P8XL is an advanced wafer probe station that offers users the ease of use, flexibility, and precision that have become paramount to achieving successful wafer assemblies and characterization tests. TOKYO ELECTRON P8-XL is equipped with an intuitive graphical user interface (GUI). This interface simplifies and streamlines operation while the integrated indicators and graphical keyboards provide quick navigation and access to functions. Additionally, the flexible wafer stage provides excellent thermal stability and robust specimen loading capabilities. TEL P8-XL also features a high-resolution digital image inspection system to facilitate simultaneous or simultaneous-off inspections. P 8 XL boasts a single-axis, precision manipulation unit for swiftly and accurately positioning probe cards and other devices. This machine features a 75mm travel range and can accurately position components in both X- and Y-axis with an accuracy of 5 µm. It can also measure and adjust test and injection points multiple times. Furthermore, it has an automatic open/close tool for probe card changing or cleaning. TEL P-8XL is well-suited for a multitude of demands and conditions. Thus, it is designed to handle a range of temperatures, atmospheres, and environments. It is also compatible with a wide variety of test probes and materials. This ensures superior performance under multiple types of conditions. TEL / TOKYO ELECTRON P8XL includes a wide array of measurement functions, such as probing, parametric testing, current leakage, leakage testing, thermal testing, and longer-term studies. Moreover, it is customizable and extremely user-friendly, enabling users to easily design custom tests and adjust settings or parameters. TEL / TOKYO ELECTRON P 8 XL also features advanced data logging and analysis capability, allowing for easy asset monitoring and analysis. In summary, P-8XL prober is an advanced technical inspection model ideal for wafer testing and characterization. It offers powerful performance, a robust design, and extreme accuracy. It is capable of handling a variety of test probes and materials. Its intuitive graphical user interface simplifies operation while its integrated indicators and graphical keyboards simplify wafer handling. It also includes an advanced digital image inspection equipment, a precise manipulation system, and data logging/analysis functions.