Used TEL / TOKYO ELECTRON P-8XL #9152955 for sale

TEL / TOKYO ELECTRON P-8XL is a hybrid prober designed by TEL (TOKYO ELECTRON) for semiconductor test and device evaluation. This advanced prober is suitable for characterising high-density semiconductor devices such as DRAMs, SRAMs, logic circuits, memory cards, and other memory devices. In addition, TEL P8XL is extremely reliable and able to handle a wide variety of device sizes, test requirements, and probing needs. TOKYO ELECTRON P8-XL features an 8-step symmetrical parallel mechanism, capable of holding and probing chips up to 300mm in diameter with a maximum prober-load capacity of 5g. The prober is designed to meet a small footprint, large probe envelope, maximum speed, and quick response time requirements. The probe stage is fully motorised with variable speed and programmable probe heights. The prober is capable of operating over a wide speed range, with an accuracy of 0.5 μm. TEL P 8 XL also features a variety of advanced probing programs, from double sided operations to contact and stripping tests. It has a fully automated contact-control system and offers a variety of probing modes, including single point, continuous points, scan point, servo-error, and 2D scanning. P-8 XL is a robust prober designed for use in semiconductor test and device evaluation. With its advanced features such as a multi-axis parallel mechanism, motorised probe stage, advanced probing programs, and automated contact-control system, it provides reliable and highly accurate performance with a broad range of device sizes and test requirements. It is suitable for a wide range of applications as well as for high volumes of testing.