Used TEL / TOKYO ELECTRON P-8XL #9152970 for sale

TEL / TOKYO ELECTRON P-8XL is an advanced prober developed by TEL Corporation. This prober is designed specifically for semiconductor wafer probing and testing. It provides a controlled and accurate environment for testing and inspecting wafer probing operations. It is equipped with a powerful 6 axes linear motor positioning equipment, a high-precision spectrophotometer, and state-of-the-art vision camera system. This prober is capable of aligning and positioning a sample wafer for testing and measuring with high accuracy and precision. TEL P8XL is equipped with TOKYO ELECTRON own high-performance Yaskawa linear motor control unit, which allows the prober to position wafers accurately and precisely with high speed. It is also equipped with a high-precision stage indexing machine for sample wafer manipulation during wafer probing. TOKYO ELECTRON P8-XL is also equipped with a sophisticated vision camera tool, which is used for pattern recognition and defect analysis. This asset uses laser illumination and advanced image processing technology to produce high-resolution images of the sample wafers. TEL / TOKYO ELECTRON P-8 XL is also equipped with a high-precision spectrophotometer. This powerful instrument is capable of measuring the spectrum of light reflected from the sample wafer. This allows for the detection of variations in wafer properties, which can be used to optimize the measurement accuracy and to detect defects or other irregularities in the pattern. Finally, TOKYO ELECTRON P 8 XL is equipped with a powerful 8-bit microcontroller. This powerful microcontroller allows for a wide range of control functions, such as wafer probing, stage design and indexing, and data logging. This microcontroller performs all the necessary calculations and operations necessary for fast and accurate wafer testing and inspection. In addition, TEL / TOKYO ELECTRON P8-XL is capable of storing and analyzing data from the entire probing process. Its sophisticated, data logging and analysis capabilities make this prober the ideal tool for semiconductor testing and probing applications.