Used TEL / TOKYO ELECTRON P-8XL #9178468 for sale
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ID: 9178468
Vintage: 1997
Prober
Type: Top loader
Chuck: Gold hot
Polisher: Circle
SACC: Flip
Temp controller: Yes
Manipulator: Yes
CPU: VIP3
VIP3A CPU upgrade
Small die options:
256 Bin para
FTP Net
HPC Chuck
HPC Isolation chuck
HPC Taiko chuck
Thin wafer option
Various OS
Probe card ring insert
OCR
(Cognex insight 1700/1701)
1997 vintage.
TEL / TOKYO ELECTRON P-8XL prober is a high-precision device designed for testing and measuring the parameters of electronic devices. It is a computer-controlled equipment that is built with a precision coordinate measurement stage and an optical microscope for probing and visual inspection. The system is comprised of a scanning prober that can measure parameters such as voltage, current, and waveform variations that are produced when a semiconductor device is tested. It can also measure the temperature and other characteristics of the semiconductor device. The probe head that is installed on the prober is able to travel across a range of 400mm in the X- and Y-axis directions. The scanning speed of the probe head is up to 16m/s, and the scanning resolution is up to 0.5µm. TEL P8XL is equipped with a CCD camera that can be used to visually inspect a device under test. The optical microscope that is installed on the unit has a magnification of up to 250X, with an option to upgrade to two cameras that provide up to 1000X magnification. The microscope can also be used for automated alignment so that a device can be precisely placed on the test board. The prober also features a sample handling machine that makes it easy to transfer samples from the prober tool to the handler. The sample handler is connected to the prober and can be programmed to move, pick and place the samples automatically, as well as perform other operations such as fastening and bonding. TOKYO ELECTRON P8-XL prober is an advanced and reliable testing and measurement tool that can evaluate a wide variety of electronic components. It can measure intricate parameters and perform complex tests that are needed to determine if a device is being correctly developed. This device is precise and versatile, making it an ideal choice for use in many applications.
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