Used TEL / TOKYO ELECTRON P-8XL #9178475 for sale

TEL / TOKYO ELECTRON P-8XL is a prober designed to measure the electrical characteristics of various materials, such as semiconductors, organic electronics, and nano-scale products. It features a wide range of components such as probes, probe arms, test cards, and various monitoring equipment. It is capable of testing up to 8 wafers with a single board at a time, up to 8 times faster than conventional models. TEL P8XL is built around a magnetic drive equipment for rapid movement of the probe carriage, and it uses a highly sensitive laser-edge-detection system to accurately locate the wafer's edge. With its high accuracy and robustness, it is ideal for a variety of prober applications such as measuring impedance, voltage, and noise on printed circuit boards. It features a fully automated low-electron-beam voltage testing solution with precise end-point control, which allows it to detect defects on a microscopic level. The laser-based edge-detection unit is highly precise and able to locate the edge of the wafer with accuracy of within several microns and even sub-micron level. It is also equipped with active thermal control with independent temperature-sensing module, providing stability and uniformity of temperature on the test wafer. Additionally, TOKYO ELECTRON P8-XL offers a variety of operation modes incorporating versatile test recipes that can cover a wide range of circuits. TEL P8-XL uses a PC-based interface, enabling users to access to prober features and settings and to generate the test configuration. For safety, the machine features an integrated safety alarm tool along with a comprehensive reference library. It is compatible with a number of industry-standard interfaces such as IEEE-488, RS-232 and IEEE-1149.1 for connection to various external data acquisition systems. It can also support multiple languages, providing multi-language operation. In conclusion, P-8 XL is a highly reliable and advanced prober that offers a diversity of features to enable efficient wafer testing. It features automated low-electron-beam voltage testing with precise end-point control, laser-edge detection asset, active thermal control and a comprehensive library of safety and operation modes. It is an ideal solution for testing various materials and wafers for various applications.