Used TEL / TOKYO ELECTRON P-8XL #9178479 for sale
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ID: 9178479
Vintage: 1997
Prober
Type: Top loader
Chuck: Gold hot
Polisher: Circle
SACC: Flip
Temp controller: Yes
Manipulator: None
CPU: VIP3
VIP3A CPU Upgrade
Small die options:
256 Bin para
FTP Net
HPC Chuck
HPC Isolation chuck
HPC Taiko chuck
Thin wafer option
Various OS
Probe card ring insert
OCR
(Cognex insight 1700/1701)
1997 vintage.
TEL / TOKYO ELECTRON P-8XL is a versatile, high-precision prober designed for semiconductor testing, electro-optical alignment, and positioning work. With its high resolution, fast response time, and easy operation, TEL P8XL is ideal for research and development, production testing and inspection, and servicing. TOKYO ELECTRON P8-XL features a large head stage with a maximum enlargement ratio of 10 μm/m, allowing for smooth and accurate alignment of wide range of semiconductors, even with small devices such as DRAM and logic ICs. The prober also offers a long travel distance of 500mm, which ensures high accuracy at long distances, and a reticle leakage current which is reduced to an extremely low level. In addition, TOKYO ELECTRON P 8 XL comes with a support arm capable of holding heavy work pieces, making it possible to perform heavy-duty probing. The arm's rotary motion is powered by a spring-operated control rod and numeric display. It also features a wide variety of optional features, such as a microplate, which increases convenience and accuracy in the alignment process. TEL / TOKYO ELECTRON P-8 XL's advanced wafer chuck features a temperature-control mechanism, making it possible to conduct heating experiments up to 150°C. The chuck's flatness is assured by an integrated vertical adjustment mechanism and a heated flat-bottom substrate chuck. Combined with a flatness sensor, this mechanism ensures extremely high accuracy results. TOKYO ELECTRON P8XL is well suited for working with large wafers, as the large table offers an exceptionally long travel distance and a variety of vertical and horizontal adjustments. TOKYO ELECTRON P-8XL also offers low noise, allowing for minimal impact on surrounding systems. It also implements auto-locking and self-displacement to ensure the reliability of the test results and prevent wafer damage. With its large head stage, high-resolution measurement and long travel distance, robust support arm, and flatness sensor, P-8 XL is a versatile and highly accurate tool for production testing and inspection, as well as research and development.
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