Used TEL / TOKYO ELECTRON P-8XL #9178484 for sale
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ID: 9178484
Vintage: 2000
Prober
Loader type: Top loader
Chuck: Gold hot & cold
Polisher: WAPP (Not include plate)
SACC: Flip
Temp Controller: Yes (D214 Type chiller connection possible)
CPU: VIP3
Manipulator: Yes
VIP3A CPU Upgrade
Small die options:
256 Bin para , FTP Net ,HPC Chuck ,HPC Isolation chuck
HPC Taiko chuck , Thin wafer option, Various OS , probe card ring insert
OCR
(Cognex Insight 1700 or 1701)
2000 vintage.
.
TEL / TOKYO ELECTRON P-8XL prober is a high-end device designed to measure the characteristics of integrated circuits. It is a fully automated prober with a maximum probing speed of 200 KHz, allowing it to accurately measure the characteristics of integrated circuits in a fast and efficient manner. TEL P8XL is equipped with a high-resolution CCD camera, a SEM imaging system, and a high-precision electrode array. This enables it to acquire detailed topographical and electrical measurements of the integrated circuit under test. Additionally, it is capable of precisely controlling probe sweeping and control voltages to ensure accurate electrical measurements. The prober is capable of processing a variety of thin film materials including silicon, aluminum, copper, and stainless steel. These can be used to safely handle high-temperature conditions or perform complex pattern analysis. The integrated thermal imaging system ensures that test samples remain stable, accurately measuring even the tiniest changes in the device under test. TOKYO ELECTRON P8-XL is also capable of automatically generating a comprehensive test report that includes in-depth electrical analysis. This report includes waveform displays, probing data, device characterization results, and more. With this data, engineers can quickly identify design and function issues with the circuit, as well as design and component problems. TOKYO ELECTRON P8XL is programmed and operated through an intuitive Graphical User Interface. This interface simplifies the initial configuration process, allows for quick access to all programmable parameters, and allows for access to more advanced analysis functions. Additionally, the software includes powerful analysis options that enable engineers to quickly identify anomalies or errors and take corrective action. Overall, P-8 XL prober is an ideal device for characterizing and testing integrated circuits. Its combination of automated probing, advanced thermal imaging, and detailed data analysis make it a must-have for both routine and more complex applications.
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