Used TEL / TOKYO ELECTRON P-8XL #9183650 for sale

TEL / TOKYO ELECTRON P-8XL is a prober used for wafer testing in semiconductor fabrication plants. It has a compact design and is capable of inspecting a wide variety of device types with its patented ultra-compact probe card equipment. The prober has an advanced spectroscopic detector and spectral analysis capabilities, allowing it to quickly and accurately detect and identify a variety of defects in wafer samples. TEL P8XL utilizes a light-weight design to provide a stable and reliable platform for wafer testing. It has a large field of view, as well as an adjustable pitch and yaw for a greater range of specimens. Additionally, it allows for variable probe contact force, which allows for a greater degree of accuracy when inspecting delicate wafer samples. The prober also features a high-speed acquisition system as well as a high-speed motion control unit which allow for faster and more accurate testing. It also includes a dual-pressure compensation machine which reduces contact between the probe and the sample surface, thus minimizing damage to the device during testing. TOKYO ELECTRON P8-XL has a variety of software options for data analysis, as well as a data logging tool which allows for precise and efficient testing. It also includes advanced defect detection and analysis capabilities which allow for a more thorough evaluation of a sample. This prober also supports a wide range of testing techniques such as 2D reflectivity, 3D reflectivity, imaging, dielectric measurement, and others. TEL / TOKYO ELECTRON P8-XL prober can be used in a variety of production testing scenarios, making it an extremely versatile tool for semiconductor manufacturing. With its advanced features and reliable performance, it is the perfect tool for high-volume testing applications.