Used TEL / TOKYO ELECTRON P-8XL #9195759 for sale

TEL / TOKYO ELECTRON P-8XL is a prober that offers superior performance, a comfortable operation and efficient automation for use in various measurement applications. It is ideal for measuring device failure characteristics, parametric evaluations, defect analysis and qualification. TEL P8XL features a rugged and reliable design to ensure long-term reliability for accurate probing. The prober is equipped with an ultra-low temperature profile for improved device cooling when probing at high temperatures. Additionally, the prober has an optimized probe head with a PTFE coated pin design for improved probe wear and chip damage prevention. The prober has a patented probe holder, which can reduce side force and vibration that is caused from high speed probing. This allows for an excellent probing performance even with small contact tips. The prober also has an adjustable force of up to 800 grams to ensure a precise and reliable contact between the tip and the sample without causing any damage. TOKYO ELECTRON P8-XL also has a number of features to help automate the probing process. It is equipped with a high-speed/high-accuracy motion control system to provide precise motion control while minimizing motion noise. Furthermore, the prober has an automated sample exchange system, which enables an efficient changing of sample cards during tests. In addition, TOKYO ELECTRON P-8XL has an integrated electrical interface board and an SPC analysis software package that helps in conducting precise analyses of device performance. The SPC software package allows users to accurately monitor the device's performance characteristics and quickly identify any device failure. TEL P8-XL prober is a reliable and precise piece of equipment for probing applications. Its advanced features provide an efficient and comfortable operation, ensuring that measurements are precise and reliable. Additionally, its automation features greatly reduce the manual input needed for tests, making it an ideal choice for various measurement applications.