Used TEL / TOKYO ELECTRON P-8XL #9203147 for sale
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ID: 9203147
Probers
Includes:
Hot chuck option: ~150°C
XY Co-ordinator and BIN / BIN GPIB Interface
GP-lB Interface assembly
Brush and polish option needle polish option
Real time wafer mapping option
Ethernet port for net use
Precise Z
Demo run probe
Demo run inking
Check voltage
Display panel
Signal tower light
Vacuum and air meter
Loader and stage action check
Buzzer
Chiller: -40°.
TEL / TOKYO ELECTRON P-8XL is a prober designed for semiconductor testing and research applications. It is equipped with a highly-sensitive probe head which provides precise operation and advanced features such as voltage, delay, and current. The equipment also supports a wide variety of measurement capabilities. The probe head is designed to provide high performance and reliability. It can be customized to support manual or automatic probing techniques. It has a high resolution of 200 microns and a sample mounting area of 140mm x 140mm. Its vertical range allows for a large range of sample sizes and shapes. The probe head can also rotate about its Z-axis for measurements from any angle. TEL P8XL prober is capable of operating at up to 16MHz and can support a wide range of test modules. It can also be used in automated tests and system integrations. It includes an intuitive user interface, making it easy to operate and configure. The prober features an advanced substrate support mechanism which allows for efficient and easy mounting. It also includes a special acoustic chamber that helps minimize probe latching and frequency drift. The prober also has an adjustable sample holder that can be adjusted for optimal testing and sample placement. TOKYO ELECTRON P8-XL prober can also support a variety of test equipment, software, and database input/output functions. It supports various types of test protocols and communication protocols. Additionally, the unit can interface with different binary adapters such as Windows/NT OS/2, Linux, or DOS. P8-XL prober is built with compatibility with a wide range of tools, such as the microscope, video machine, thermal imaging camera, and optical microscope. It is designed to be flexible and robust, providing reliable performance while meeting the requirements of modern semiconductor testing. The prober also supports various safety protocols, including a safety lock for the sample area. It also supports different environmental conditions such as temperature, pressure, and humidity.
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