Used TEL / TOKYO ELECTRON P-8XL #9205865 for sale

TEL / TOKYO ELECTRON P-8XL is a prober used for electrical testing and probing of semiconductor wafers and integrated components. It has a scanning force quickly moving across the sample surface, for accurate and precise contact identification. The main features of TEL P8XL include an improved laser-mark detection equipment, advanced pattern recognition, and an ultra-low contact force (CLF) inspection mode. TOKYO ELECTRON P8-XL features a unique optical system that employs a laser line-mark recognition for localizing wafer or IC pattern points on the sample surface. This enables faster and more precise probing of semiconductor wafers and components. The improved pattern recognition unit of P 8 XL can acquire more accurate measurements from complicated patterns, enabling higher quality control. The wafer probe comes as a precision mechanic machine with a Vacuum Chuck, Closed Circuit Loading Apparatus, and Probe Needle Carrier. For accurate data collection, the wafer probe includes Static-Electricity Countermeasures, designed to reduce static electricity from each probe and contact. To further ensure accurate measurements, the prober also features a vibration damper and a special shield to reduce electromagnetic noise. P8XL also has an advanced CLF inspection mode which stands for "Coarse Low-Force". This allows contact measurements and inspections to be done quickly with very low contact force. Data from measurements performed with CLF is more reliable and withstands higher temperature more effectively due to its low contact force. TEL P8-XL is designed for high precision and high accuracy probing and contact testing. It has an improved low-contact-force inspection mode, advanced pattern recognition, and a unique laser mark detection machine for greater accuracy and speed. The wafer probe is designed to work with a variety of semiconductor wafers and ICs, making it an invaluable tool in the production process.