Used TEL / TOKYO ELECTRON P-8XL #9221514 for sale

TEL / TOKYO ELECTRON P-8XL is a prober designed for high-performance probing and electrical testing of the most advanced semiconductor chips. TEL P8XL is a fully integrated automation solution, combining a CNC-based motion equipment, high performance electrical probe heads and advanced system communications. The tools provide superior accuracy at fast probing rates, and are capable of probing densities up to 1,152 pads per second. The integrated CNC motion unit in TOKYO ELECTRON P8-XL provides superior accuracy in X-Y-Z axis, allowing for fast and efficient movement of the prober. TOKYO ELECTRON P 8 XL also offers a high-speed 3-axis scanning machine for rapid test semi-configurable pattern scanning. This tool enables flexible and precise rapid testing of even the most complex die configurations. Additionally, TEL / TOKYO ELECTRON P8-XL features integrated high-performance probe heads, allowing for high-precision probing at high speeds (1,152 pads per second) while minimizing wafer damage. TOKYO ELECTRON P8XL's advanced communications asset enables reliable access to test programs from any location in the facility, allowing the model to be used to support the high throughput and efficiency requirements of wafer fabrication. Additionally, advanced equipment control systems allow users to manage multiple tests and configurations for efficient use of the probe unit. P8XL's user interface is easy to use and intuitive, and supports a wide range of operational controls as well as log and history management. Advanced diagnostic tools allow for efficient troubleshooting and quick resolution of system problems. Finally, P 8 XL unit also includes a range of safety features, ensuring maximum protection for operators and ensuring safe and reliable operation in any environment. Overall, P-8XL prober is an advanced automation solution for probing and electrical testing of the most advanced semiconductor chips. TEL P-8 XL's integrated CNC-based motion machine, high performance electrical probe heads, advanced tool communications, and user-friendly interface enable fast, accurate, and reliable performance.