Used TEL / TOKYO ELECTRON P-8XL #9250431 for sale

TEL / TOKYO ELECTRON P-8XL prober is a fully automated, high-speed device designed to measure and evaluate semiconductor wafer parametrics, such as die size, device parameters, and edge roughness. The prober uses an 8-inch wafer chuck with a maximum width of 7.8 inches, and allows for 3 axes of movement. This machine is capable of analyzing samples with a frequency of up to 10,000 kHz. Designed to be able to accommodate both standard and proprietary configurations, TEL P8XL facilitates on-the-fly afocal sensing and editing for precise results. The prober's scanning algorithm is able to measure different device types regardless of their size or geometry. To ensure accuracy, a dual focus system is utilized to provide both x and y orthogonality for better measurement repeatability and precision. TOKYO ELECTRON P8-XL is designed to improve overall productivity for measuring and evaluating wafers by providing a one-step defect review process. The prober is capable of measuring over 500 wafers in a single hour, with warp mapping capability for wafers up to 150 mm in diameter. The included software is user-friendly, helping to accelerate the measuring process to save time and reduce costs. TEL / TOKYO ELECTRON P8-XL is also built with safety features that allow users to work in a safer and more reliable environment, such as cam-style door sensors and E-Stop buttons. Additionally, the device comes with a redundant system architecture that allows for the primary controlling component and main power supply to be switched in the event of an emergency. TEL P-8 XL is a reliable and sturdy prober that is capable of measuring, testing, and evaluating wafer parametrics with speed and precision. With features such as powerful analysis software, dual focus system, speed of up to 10,000 kHz, and warp mapping capability, P-8XL is a staple tool in the wafer evaluation process.