Used TEL / TOKYO ELECTRON P-8XL #9255227 for sale

TEL / TOKYO ELECTRON P-8XL
Manufacturer
TEL / TOKYO ELECTRON
Model
P-8XL
ID: 9255227
Vintage: 2003
Probers 2003 vintage.
TEL / TOKYO ELECTRON P-8XL is a multi-purpose semiconductor prober designed for achieving accurate and repeatable measurement results. The prober features a high-precision, high-speed scanning function and is capable of handling a wide variety of substrate toppings and can be used on devices with features as small as 5 µm. TEL P8XL has a highly reliable and precise semiconductor prober designed for effective measurements and accuracy testing. It utilizes a dual-axis scanning stage that allows for rapid probing of devices with different sizes, heights, and patterns. The large scan size of 150 mm x 200mm is also useful for large-area device characterization. TOKYO ELECTRON P8-XL is equipped with an auto-focus system to ensure that the measurement probe is always correctly positioned to the test substrates. It has an automatic wafer alignment function that allows TOKYO ELECTRON P-8 XL to quickly and accurately detect the substrates. The optional wafer rotation bracket allows P8XL to automatically rotate substrates while performing measurements. Additionally, TEL P-8XL has an integrated vibration dampening system, which minimizes the influence of external vibration and dramatically reduces measurement errors. P8-XL is also equipped with an advanced z-axis controller that is capable of measuring distances as short as 5 µm. This controller is used to accurately control the gap between the probe tip and the surface of the substrate, to ensure the integrity of the measurement results. TEL P 8 XL is a powerful and cost-effective semiconductor prober that allows users to accurately and repeatably perform precision measurements in a wide variety of substrate formats. It is equipped with the necessary tools to ensure a precise, reliable, and accurate repeatable measurement results. Its range of features, coupled with its user-friendly design make it the perfect choice for any semiconductor prober and characterization needs.
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