Used TEL / TOKYO ELECTRON P-8XL #9261123 for sale

TEL / TOKYO ELECTRON P-8XL is a prober equipment designed for wafer chip testing and probing. It is capable of performing analysis and testing on a single chip or wafer up to 8" in diameter, for precise monitoring of integrated circuits and components. It is designed to accurately measure wire bond pads, contact areas and circuit geometries and feature low noise electronic measurements for high precision results. TEL P8XL utilizes precise XYZ positioning for the probe assembly to ensure accurate and repeatable contact between test probes and chips. An intuitive graphical user interface (GUI) allows for simple, step-by-step operation. Probing can be done with an adapter head holding greater than 40 probes or using an indexing plate that holds up to 60 probes. Probes are typically made of carbon fiber, silicone or stainless steel for excellent electrical conductivity and long lifespan. This system also includes several safety features, such as a die block detection unit to ensure no accidental probe contact with an adjacent chip, and a deformable substrate wafer detection machine which allows for real-time detection of chip movement or substrate deformation. TOKYO ELECTRON P8-XL is compatible with a wide range of probing systems and can be integrated with inspection equipment for quality assurance. It has an automatic level control tool which maintains contact size and positional accuracy within 0.5 µm; and an automatic alignment asset which correlates the probe position and the real structure of the chip. P-8XL includes high-speed scanning of patterned substrates; transient testing of multiple systems simultaneously for improved performance; and improved pattern recognition capabilities. It is a highly reliable and precise prober that makes use of the latest technologies in wafer chip testing and probing and provides a user friendly interface for fast and accurate results.