Used TEL / TOKYO ELECTRON P-8XL #9379919 for sale

TEL / TOKYO ELECTRON P-8XL is a prober that provides a wide range of advanced features for the most demanding probing applications. It is designed to provide higher throughput and accuracy than traditional probing systems. TEL P8XL combines high-speed scanning with precise placement of probes and support for a variety of probe techniques. Its flexibility and reliability also make it ideal for wafer-level testing. TOKYO ELECTRON P8-XL features a probe card assembly equipment with a multi-stage arm positioning system and a high-rigidity stage. This ensures precise positioning of probes and reduces the risk of damaging the devices when probing. It also contains an up to 8-probe head unit, which provides high-accuracy operation even at high-speed scanning rates. The prober is equipped with an automatic, non-contact, pneumatic probe head protection machine for protecting the probes from possible damage. Its advanced software provides a wide variety of probing capabilities for the most challenging challenges. It is equipped with advanced PC control applications that enable you to quickly and easily modify the probing setup. This includes the ability to customize the probe pattern, and to modify the probe cards and packages. Its comprehensive error report tool assists in troubleshooting any issues that occur during probing. TEL / TOKYO ELECTRON P 8 XL is designed to provide high productivity and throughput. Its advanced data collection and analysis features allow for rapid analysis of large data sets. It also supports a variety of data formats such as Touchstone, OpenAccess, FITS, and VCD. Its data capture rate and repeatability are among the highest in its class. TEL / TOKYO ELECTRON P8XL is an advanced prober asset that offers a wide range of capabilities for the most demanding testing applications. Its precise placement of probes, high-speed scanning, and comprehensive software make it a reliable and efficient solution for wafer-level testing. Its advanced data collection and analysis features allow for rapid analysis of large data sets.