Used TEL / TOKYO ELECTRON P-8XL #9379922 for sale

TEL / TOKYO ELECTRON P-8XL is a high-performance, computer-controlled prober designed specifically for semiconductor device testing in a variety of environments. This equipment offers superior probing performance and accuracy with versatility and scalability to maximize yield and increase productivity. TEL P8XL utilizes a precision, high-resolution Servo Positioning System (SPS) to allow for fast, accurate probing of small devices. The SPS is capable of providing up to 0.1 µm accuracy for repeatable probes, providing higher yields with fewer false-positive probe results. This unit also offers a thermally stable design for precise and reliable probe endpoint measurements. The prober also includes an air-shielding machine that helps maintain clean air around the probing head to minimize the risk of contamination due to airborne particles. The advanced optics-driven image processing tool allows for improved measurement accuracy, regardless of the device under test. It uses image recognition for exact alignment of multiple types of devices with resolutions up to 2 μm. The on-board optical asset can perform advanced multi-point measurements without additional hardware. TOKYO ELECTRON P8-XL supports a wide variety of devices and package types, including standard BGA, Flip Chip, Bare die, GQFP, QFP, QFN, and other microelectronics packages. It is also compatible with a range of edge contactors and speciality external pins and adaptors for high-density probing. This prober also offers advanced programmable options for various device probe applications, including DC, IV, and time-domain testing. TEL / TOKYO ELECTRON P8-XL provides superior testing performance for a wide variety of device types, with accurate and repeatable results. This model offers a stable platform for detecting defects and measuring device characteristics and is designed to reduce false-positive results, increase yields, and improve overall device testing performance.