Used TEL / TOKYO ELECTRON P-8XL #9388100 for sale

Manufacturer
TEL / TOKYO ELECTRON
Model
P-8XL
ID: 9388100
Vintage: 2006
Wafer prober Nickel hot chuck Hot temperature controller WAPP VIP4 Board 2006 vintage.
TEL / TOKYO ELECTRON P-8XL Prober is a multi-purpose probing equipment designed for advanced semiconductor wafer testing. It provides a wide range of wafer testing capabilities, including optical, electrical, and mechanical probing capabilities. The system is capable of full wafer probing with high repeatability and fast throughput. The unit supports both contact and Remote SEMIV probe heads, with a wide range of probe tips for electrical testing. The multi-axis XYZ linear stages allow for precise probing over a range of die sizes. TEL P8XL also features automatic alignment capabilities to aid with repeatable probing. The machine has a fully automated optical aligment alignment tool for simple calibration of the probe. The optical view alignment is fully automated to aid efficient probing, and the wafer is mounted on air bearings for smooth and accurate movement. The entire asset is temperature controlled for precise results and minimal calibration drift. TOKYO ELECTRON P8-XL features a proprietary 'check pattern' feature which can be used to verify the probe position, allowing for rapid and accurate scanning of the wafer. The proprietary TEL Wafer Map software is included for complete test data storage and analysis. The results can then be exported to an external database, enabling easy comparison and analysis of different testing scenarios. TEL / TOKYO ELECTRON P8-XL is an ideal model for advanced applications such as die-level integration testing and sorter testing. It is also well suited for failure analysis and defect characterization. With its versatile and reliable probing capabilities, TOKYO ELECTRON P8XL Prober is an excellent choice for advanced semiconductor wafer testing.
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