Used TEL / TOKYO ELECTRON P-8XL #9388106 for sale

TEL / TOKYO ELECTRON P-8XL is a highly advanced, state-of-the-art prober designed to satisfy the most demanding wafer test and device-evaluation needs. It enables probe contact, electrical testing, and sample inspection with a single machine combining standard TEL advanced performance and a number of newly developed solutions. The prober is equipped with an incredibly robust, vibration and vibration-free design and a small footprint. This ensures the utmost accuracy and repeatability of measurements in the tiny space allotted for a prober. Additionally, the machine is capable of advanced, multi-step test sequence processes that make it ideal for applications such as stability testing, characterization, wafer life testing and device evaluation. TEL P8XL utilizes a proprietary XY-Protocol, providing a wide field of view with optimized focus and resolution capabilities. The test head, which is equipped with a 200 micron x-y-z positioning system, enables accurate contact between probes and substrate. To help streamline processes, TOKYO ELECTRON P8-XL is designed with pattern recognition technology that can match up to 512 points with any type of submicron feature size. Another valuable feature of the machine is its ability to switch between different probe types in a single test. This saves time and enables users to test various device parameters at once. In addition, TEL / TOKYO ELECTRON P8-XL is designed with a dynamic performance feature that allows for sophisticated testing that incorporates all the data gathered in the test process into a single result. TEL P8-XL's user-friendly interface is easy to operate and offers an intuitive, touch-sensitive control panel. The machine also offers built-in diagnostic and support systems. A helpful array of warnings and alarms keep users updated on system health and any potential problems. Over all, TOKYO ELECTRON P8XL is an advanced, user-friendly testing tool that provides superior accuracy, repeatability, and adaptability. It is used in a wide array of electrical tests, device evaluation, and wafer test applications.